Title :
Investigation of continuous wave immunity test conditions for telecommunication equipment
Author :
Kanno, Shin ; Takemoto, Fusaji ; Rikiishi, Satoru ; Kuwabara, Nobou
Author_Institution :
NTT Telecommun. Networks Labs., Tokyo, Japan
Abstract :
The relation between continuous wave immunity test conditions and failure results of equipment under test is discussed. The difference between the radiated immunity test and the conductive immunity test, and the use of the impress durations and sweep rates to detect failure are investigated. As a results, it is clarified that the results of the radiated immunity test are different from that of the conducted immunity test
Keywords :
electromagnetic compatibility; printed circuit testing; radiofrequency interference; telecommunication equipment testing; 26 to 80 MHz; conductive immunity test,; continuous wave immunity test conditions; equipment under test; failure results; impress durations; radiated immunity test; sweep rates; telecommunication equipment; Cables; Central Processing Unit; Communication system control; IEC standards; Immunity testing; Interference; Laboratories; Printed circuits; Radio frequency; Solid state circuits;
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
DOI :
10.1109/ISEMC.1994.385601
