• DocumentCode
    2555039
  • Title

    A roadmap for NASA´s radiation effects research in emerging microelectronics and photonics

  • Author

    LaBel, Kenneth A. ; Barnes, Charles E. ; Marshall, Cheryl J. ; Marshall, C.J. ; Johnston, Allan H. ; Reed, Robert A. ; Barth, Janet L. ; Seidleck, Christina M. ; Kayali, Sammy A. ; Bryan, Martha V O

  • Author_Institution
    NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    535
  • Abstract
    The Electronics Radiation Characterization (ERC) project of the NASA Electronic Parts and Packaging (NEPP) Program is responsible for the radiation effects research on microelectronics and photonics for NASA. In this presentation, we present our roadmap for providing aid to NASA flight projects, technology developers, and the aerospace community
  • Keywords
    radiation hardening (electronics); space vehicle electronics; technological forecasting; NASA electronics radiation characterization project; core flight customer support; data dissemination; enabling parameter reductions; microelectronics; photonics; radiation effects research; radiation tolerance roadmap; single event upsets; technology evaluation; Aerospace electronics; Aircraft; Hazards; Microelectronics; NASA; Photonics; Radiation effects; Space shuttles; Space technology; Space vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference Proceedings, 2000 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-5846-5
  • Type

    conf

  • DOI
    10.1109/AERO.2000.878527
  • Filename
    878527