DocumentCode :
2555501
Title :
Effect of treated silver nanoparticles to electrical conductivity improvement of electrically conductive adhesive (ECA)
Author :
Kornain, Zainudin ; Amin, Nowshad ; Jalar, Azman ; Cheah, Ang Ye ; Ahmad, Ibrahim
Author_Institution :
Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi
fYear :
2008
fDate :
25-27 Nov. 2008
Firstpage :
549
Lastpage :
553
Abstract :
Electrically conductive adhesive (ECA) is a popular alternative to replace lead solder interconnect material in most areas of electronic packaging. ECA mainly consists of an organic/polymeric binder matrix and metal filler. These composite materials provide both physical adhesion and electrical conductivity. Compared to the solder technology, ECA offers numerous advantages, such as environmental friendliness, lower processing temperature, fewer processing steps (reducing processing cost), and especially, the fine pitch capability attributed to the availability of small sized conductive fillers. Here, 70-nm sized silver particle filler (Ag) has been used to study the effect to electrical conductivity of ECA after surface treatment. Upon surface treatment of silver with silane-based coupling agent, the treated silver filled epoxy system demonstrated incredible improvement in electrical properties. The current conductivity (DC) for treated filler was 4.01 S/cm compared with untreated filler with 4.54E-03 S/cm for 5%w filler loading. Morphological studies using light microscopy micrographs have shown perceptible enhancement in filler dispersivity after treatment.
Keywords :
conductive adhesives; electronics packaging; graph theory; matrix algebra; nanotechnology; surface treatment; current conductivity; electrically conductive adhesive; electronic packaging; lead solder interconnect material; light microscopy micrographs; metal filler; nanoparticles; organic/polymeric binder matrix; surface treatment; Conducting materials; Conductive adhesives; Conductivity; Electronics packaging; Lead; Nanoparticles; Polymers; Silver; Surface morphology; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4244-3873-0
Electronic_ISBN :
978-1-4244-2561-7
Type :
conf
DOI :
10.1109/SMELEC.2008.4770385
Filename :
4770385
Link To Document :
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