DocumentCode
2555582
Title
An Edge Breakdown Free MOS-avalanche Photodiode Image Sensor Cell
Author
Komobuchi, H. ; Punakoshi, H. ; Fukumoto, A. ; Yamada, T.
Author_Institution
Matsushita Electric Industrial Co.,Ltd.
fYear
1992
fDate
2-4 June 1992
Firstpage
312
Lastpage
313
Keywords
Charge coupled devices; Charge-coupled image sensors; Circuit testing; Electric breakdown; Gain control; Image sensors; Laboratories; Noise reduction; Photodiodes; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics, 1992. Digest of Technical Papers. ICCE., IEEE 1992 International Conference on
Conference_Location
Rosemont, IL, USA
Print_ISBN
0-7803-0479-9
Type
conf
DOI
10.1109/ICCE.1992.697240
Filename
697240
Link To Document