DocumentCode :
2555582
Title :
An Edge Breakdown Free MOS-avalanche Photodiode Image Sensor Cell
Author :
Komobuchi, H. ; Punakoshi, H. ; Fukumoto, A. ; Yamada, T.
Author_Institution :
Matsushita Electric Industrial Co.,Ltd.
fYear :
1992
fDate :
2-4 June 1992
Firstpage :
312
Lastpage :
313
Keywords :
Charge coupled devices; Charge-coupled image sensors; Circuit testing; Electric breakdown; Gain control; Image sensors; Laboratories; Noise reduction; Photodiodes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics, 1992. Digest of Technical Papers. ICCE., IEEE 1992 International Conference on
Conference_Location :
Rosemont, IL, USA
Print_ISBN :
0-7803-0479-9
Type :
conf
DOI :
10.1109/ICCE.1992.697240
Filename :
697240
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2555582
بازگشت