Improvement of metrological characteristics in computer-based digital oscilloscope systems

Author

Semianovich, S.N. ; Stetsko, I.P. ; Tchoudovski, V.A.

fYear

2004

fDate

15-16 Sept. 2004

Firstpage

329

Lastpage

334

Keywords

Oscilloscopes;

fLanguage

English

Publisher

ieee

Conference_Titel

Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. International Conference on

Print_ISBN

0-7803-8442-3

Type

DOI

10.1109/APEDE.2004.1393584

Filename

1393584

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