Title :
Validation of GATE Monte Carlo simulations of the Philips GEMINI TF and TruFlight Select PET/CT scanners based on NEMA NU2 standards
Author :
Trindade, A. ; Rodrigues, P. ; Perkins, Amy E. ; Miller, Miles A. ; Narayanan, Meyyappan ; Griesmer, Jerome ; Chi-Hua Tung ; Bin Zhang ; Lingxiong Shao ; Laurence, Thomas ; Solf, T. ; Wieczorek, Rerfried
Author_Institution :
Philips Res. Eur., Eindhoven, Netherlands
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
The objective of this study is to validate the in-house GATE simulations of the Philips GEMINI TF and TruFlight Select PET scanners and evaluate their accuracy for further research and optimization of current and future PET products. GATE results are compared to experimental data obtained according to the National Electrical Manufacturers Association (NEMA) NU2-2007 standards. A detailed implementation of the geometrical and functional models of the scanners and the NEMA phantoms was conducted, allowing the evaluation of the simulated absolute sensitivity, spatial resolution, count rates and the image quality of both systems. All Monte Carlo data production was performed according to the NEMA protocols. Simulated data were converted into the Philips list-mode format and analyzed using the same software tools as in the quality control step of the production line. Good agreement was found between the simulated results and the measured data from both scanners. This validation study represents an important step towards the use of these tools as an aid for the optimization of the current acquisition protocols and the validation of reconstruction and data correction techniques.
Keywords :
Monte Carlo methods; computerised tomography; image reconstruction; medical image processing; phantoms; positron emission tomography; quality control; CT scanner; GATE Monte Carlo simulations; Monte Carlo data production; NEMA NU2 standard; NEMA phantom; NEMA protocol; National Electrical Manufacturers Association; PET scanner; Philips list-mode format; computed tomography; data correction technique; data measurement; data simulation; positron emission tomography; quality control; reconstruction correction technique; software tool; system absolute sensitivity simulation; system count rate simulation; system image quality simulation; system spatial resolution simulation;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551582