• DocumentCode
    2555722
  • Title

    Broadband EMI shielding for electro-optical systems

  • Author

    Bright, Clark I.

  • Author_Institution
    Southwall Technol. Inc., USA
  • fYear
    1994
  • fDate
    22-26 Aug 1994
  • Firstpage
    340
  • Lastpage
    342
  • Abstract
    Electromagnetic interference (EMI) shielding of apertures in electro-optical (EO) systems can be accomplished generally by transparent electrically conductive (EC) coatings, wire meshes or opaque EC coatings patterned to form meshes. The shielding effectiveness (SE) of these methods are studied both analytically and experimentally. The shielding due to both absorption and reflection as a function of frequency was evaluated. EO systems often use aperture windows made of dielectric or semiconductive material which transmit in the optical waveband(s) of interest. The effect of the substrate material on the SE of the both deposited transparent EC coatings and on opaque mesh patterned EC coatings is examined. The broadband shielding benefits of using aperture windows with EC coatings deposited on semiconductive window substrates is proposed
  • Keywords
    coatings; dielectric materials; electro-optical devices; electromagnetic shielding; semiconductor materials; absorption; aperture windows; apertures; broadband EMI shielding; dielectric material; electro-optical systems; electromagnetic interference shielding; frequency; opaque EC coatings; reflection; semiconductor material; shielding effectiveness; transparent electrically conductive coatings; wire meshes; Apertures; Coatings; Dielectric materials; Dielectric substrates; Electromagnetic interference; Electromagnetic wave absorption; Optical materials; Optical reflection; Semiconductor materials; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1398-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1994.385634
  • Filename
    385634