Title :
Measurement techniques for permeability, permittivity and EMI shielding: a review
Author_Institution :
Lockheed Palo Alto Res. Lab., CA, USA
Abstract :
With the advent of more sophisticated network analyzers and spectrum analyzers, the ability to fully characterize the constitutive parameters of material over very broad frequency ranges has become feasible with relatively simple fixtures. The paper reviews various methods of measurement and the advantages and limitations of each technique. Newer methods, such as the permeameter and force gradient magnetometer, are examined as well as older approaches such as the VSM and transmission line methods. A brief discussion of shielding measurements and simple models is included. A comprehensive reference list is provided
Keywords :
electromagnetic shielding; magnetic permeability measurement; magnetometers; network analysers; permittivity measurement; reviews; spectral analysers; transmission lines; EMI shielding; VSM; force gradient magnetometer; measurement techniques; network analyzers; permeability; permeameter; permittivity; review; shielding measurements; spectrum analyzers; transmission line method; Electromagnetic interference; Fixtures; Frequency; Magnetic analysis; Magnetic materials; Measurement techniques; Permeability; Permittivity; Spectral analysis; Transmission line measurements;
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
DOI :
10.1109/ISEMC.1994.385635