• DocumentCode
    2555754
  • Title

    Improvement of backside emission analysis sample prep process for BGA

  • Author

    Rani, Khairizam Abd ; Arumugam, Rameshwaren

  • Author_Institution
    Spansion (Penang) Sdn Bhd, Penang
  • fYear
    2008
  • fDate
    25-27 Nov. 2008
  • Firstpage
    600
  • Lastpage
    603
  • Abstract
    Current method of BGA sample preparation repackaging process for backside emission analysis is by applying direct bonding from the exposed gold wire on the bottom of the package to the lead frame of the secondary open top package. The exposed gold wire on the package bottom is achieved through the back grinding process. The very small diameter of the exposed gold wire on the backside of the BGA which is about 1.0 mil in diameter has imposed difficulty during the manual re-bonding process. The re-bonding process requires a skillful person as it requires high precision bonding. A single wire bonding itself may require several attempts in order to form a good bond/ joint on the exposed gold wire. With this scenario we will also be facing more challenges in the future as we are moving towards qualifying thinner wire for production.
  • Keywords
    ball grid arrays; bonding processes; grinding; specimen preparation; BGA sample preparation repackaging; back grinding; backside emission analysis; re-bonding; selected area grinding; Bonding; Copper; Etching; Gold; Lead; Metallization; Packaging machines; Polishing machines; Production; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4244-3873-0
  • Electronic_ISBN
    978-1-4244-2561-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.2008.4770397
  • Filename
    4770397