DocumentCode
2555819
Title
A useful etchant to create cavitations of cobalt salicide layer in a cross-sectioned sample
Author
Ping, Alvin Chan Tze
Author_Institution
X-FAB Sarawak Sdn Bhd, Kuching
fYear
2008
fDate
25-27 Nov. 2008
Firstpage
619
Lastpage
621
Abstract
Traditional cross-sectional sample treatment methods such as BOE (Buffered oxide etch), can easily highlight Titanium Salicide (TiSi2) by etching away the TiSi2 (thus creating voids or cavitations) with no impact on the silicon underneath the salicide. However, this method does not work for devices using Cobalt Salicide (CoSi2) technology. The work presented here is to introduce a special etchant or chemical mix that will etch the Cobalt Salicide (CoSi2), with no significant impact on the silicon underneath the salicide layer.
Keywords
cavitation; cobalt compounds; etching; voids (solid); CoSi2; buffered oxide etch; cavitations; chemical mix; cobalt salicide layer; etchant; etching; silicon; voids; Chemical technology; Cobalt; Contact resistance; Etching; Semiconductor devices; Semiconductor materials; Silicon; Surface treatment; Switches; Titanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
Conference_Location
Johor Bahru
Print_ISBN
978-1-4244-3873-0
Electronic_ISBN
978-1-4244-2561-7
Type
conf
DOI
10.1109/SMELEC.2008.4770401
Filename
4770401
Link To Document