• DocumentCode
    2555819
  • Title

    A useful etchant to create cavitations of cobalt salicide layer in a cross-sectioned sample

  • Author

    Ping, Alvin Chan Tze

  • Author_Institution
    X-FAB Sarawak Sdn Bhd, Kuching
  • fYear
    2008
  • fDate
    25-27 Nov. 2008
  • Firstpage
    619
  • Lastpage
    621
  • Abstract
    Traditional cross-sectional sample treatment methods such as BOE (Buffered oxide etch), can easily highlight Titanium Salicide (TiSi2) by etching away the TiSi2 (thus creating voids or cavitations) with no impact on the silicon underneath the salicide. However, this method does not work for devices using Cobalt Salicide (CoSi2) technology. The work presented here is to introduce a special etchant or chemical mix that will etch the Cobalt Salicide (CoSi2), with no significant impact on the silicon underneath the salicide layer.
  • Keywords
    cavitation; cobalt compounds; etching; voids (solid); CoSi2; buffered oxide etch; cavitations; chemical mix; cobalt salicide layer; etchant; etching; silicon; voids; Chemical technology; Cobalt; Contact resistance; Etching; Semiconductor devices; Semiconductor materials; Silicon; Surface treatment; Switches; Titanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2008. ICSE 2008. IEEE International Conference on
  • Conference_Location
    Johor Bahru
  • Print_ISBN
    978-1-4244-3873-0
  • Electronic_ISBN
    978-1-4244-2561-7
  • Type

    conf

  • DOI
    10.1109/SMELEC.2008.4770401
  • Filename
    4770401