Title :
Generation of the different forms of the test tasks from tasks on correspondence to high order
Author :
Zaharov, A.A. ; Nurgaliev, R.R. ; Senokosava, T.G.
Keywords :
Artificial intelligence; Testing;
Conference_Titel :
Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. International Conference on
Print_ISBN :
0-7803-8442-3
DOI :
10.1109/APEDE.2004.1393597
