Title :
Analysis of electric stress distribution due to load current in solid dielectric cables
Author_Institution :
Dept. of Electr. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
An analytic model is developed to estimate quantitatively the effect of the load current as the source of electrical stress in solid dielectric cable. The wave equation for the conductor is solved by dividing the conductor into an infinite number of infinitesimally thin cylindrical shells to account for the distribution of current density within the conductor. The induced electric field as a result of loading power cables is investigated at different operating and testing conditions. It is demonstrated that this method can be useful in calculating the actual stress in cables for heavy current applications and accelerating testing (ageing) at higher frequencies. The model has been successful in explaining the role of the pertinent cable parameters, and also in understanding the influence of the various factors on the electric field distribution in the insulation layer
Keywords :
ageing; cable insulation; current distribution; insulation testing; life testing; load (electric); power cables; accelerating testing; ageing; analytic model; current density distribution; electric stress distribution; heavy current applications; induced electric field; infinitesimally thin cylindrical shells; insulation layer; load current; power cables; solid dielectric cables; testing conditions; wave equation; Accelerated aging; Conductors; Current density; Dielectrics; Life estimation; Partial differential equations; Power cables; Solid modeling; Stress; Testing;
Conference_Titel :
Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on
Conference_Location :
Cambridge, MA
DOI :
10.1109/ELINSL.1988.13936
