DocumentCode :
2555967
Title :
Broadband time-domain measurement system applied to the characterization of cross-modulation in nonlinear microwave devices
Author :
Abouchahine, M. ; Saleh, A. ; Neveux, G. ; Reveyrand, T. ; Teyssier, J.P. ; Barataud, D. ; Nebus, J.M.
Author_Institution :
XLIM, Univ. of Limoges, Limoges, France
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
1201
Lastpage :
1204
Abstract :
This paper presents a calibrated 4 channel broadband time-domain measurement system for the characterization of nonlinear microwave devices. The hardware architecture of the proposed measurement system is described with particular emphasis on the samplers and intermediate frequency (IF) circuit configuration. The sampling heads are working at a high strobe signal repetition frequency that can be tuned between 357 MHz and 536 MHz. 40 GHz RF frequency bandwidth is achieved. The calibration procedure of this system is also described. This instrument is then used for cross-modulation characterization of a 15W GaN HEMT CREE power amplifier at S Band. Cross-modulation measurements between a double side band amplitude modulation and a single tone signal at a 60 MHz offset frequency are performed to illustrate the capabilities of the proposed system. Time-domain waveforms are measured and variations of amplitude and phase modulation indices versus input power are recorded.
Keywords :
amplitude modulation; microwave devices; phase modulation; time-domain analysis; amplitude modulation; broadband time-domain measurement; calibration procedure; cross-modulation; frequency 357 MHz to 536 MHz; frequency 40 GHz; frequency 60 MHz; intermediate frequency circuit configuration; nonlinear microwave device; phase modulation; time-domain waveform; Circuits; Frequency measurement; Hardware; Microwave devices; Microwave measurements; Particle measurements; RF signals; Radio frequency; Sampling methods; Time domain analysis; GaN power amplifiers; Nonlinear microwave circuits; Time-domain measurements; cross-modulation (CM);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165918
Filename :
5165918
Link To Document :
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