DocumentCode
2556010
Title
Shield degradation in the presence of external conductors
Author
Brench, Bronwyn L. ; Brench, Colin E.
Author_Institution
DJR Associates, Stow, MA, USA
fYear
1994
fDate
22-26 Aug 1994
Firstpage
269
Lastpage
273
Abstract
When an external conductor is located in close proximity to apertures in an EMI shield the amount of energy coupled through these apertures can be greatly increased. Earlier work by the authors was limited to problems where the geometry was small compared to the wavelength of interest. Using the finite difference time domain (FDTD) technique a solution can be found for much larger geometries. A variety of geometries have been analyzed and the findings are presented in this paper
Keywords
conducting materials; electromagnetic interference; electromagnetic shielding; field strength measurement; finite difference time-domain analysis; EM coupling; EMI shield; FDTD; apertures; conducting materials; external conductors; filed strength measurement; finite difference time domain; geometry; shield degradation; wavelength; Apertures; Cables; Conductors; Degradation; Electromagnetic interference; Finite difference methods; Geometry; Monitoring; Solid modeling; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-1398-4
Type
conf
DOI
10.1109/ISEMC.1994.385648
Filename
385648
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