• DocumentCode
    2556121
  • Title

    Miniature RF MEMS switch matrices

  • Author

    Fomani, A.A. ; Mansour, R.R.

  • Author_Institution
    Center for Integrated RF Eng. (CIRFE), Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    1221
  • Lastpage
    1224
  • Abstract
    A novel miniature-size switching unit is reported for application as the building block of multiport switch matrices. The cell consists of 3 cantilever-beam contact type MEMS devices coupled to CPW transmission lines. A major feature of the proposed switch cell is that in each of the operating states there is only one MEMS switch located in the path of signal inducing a similar loss for all switching states. The construction of the entire system is carried out by a six-mask fabrication process. To minimize the unwanted coupling of the RF signal through the bias lines of MEMS devices, high-resistive phosphorous-doped hydrogenated amorphous silicon (n+ a-Si:H) is selected as a material of choice for the dc bias lines. The switching unit has been employed to build a 4times4 switch matrix measuring 1.45 times 1.45 mm2 in dimensions. The system presents an excellent RF performance with the worst-case insertion loss, return loss, and isolation of -1.8 dB, -17 dB and 26 dB up to 40 GHz, respectively.
  • Keywords
    matrix algebra; microswitches; phosphorus; CPW transmission line; RF MEMS switch matrix; cantilever-beam; high-resistive phosphorous; hydrogenated amorphous silicon; miniature-size switching unit; multiport switch matrices; Contacts; Coplanar waveguides; Couplings; Insertion loss; Microelectromechanical devices; Microswitches; Radiofrequency microelectromechanical systems; Switches; Transmission line matrix methods; Transmission lines; Multiport circuits; RF MEMS; high isolation; low insertion loss; switches; switching systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165923
  • Filename
    5165923