Title :
Simulation studies with SiPM arrays and LYSO crystal matrix analyzing a new readout scheme
Author :
Krizsan, Aron K. ; Kis, Sandor A. ; Gal, Janos ; Hegyesi, Gyula ; Balkay, L.
Author_Institution :
Inst. of Nucl. Med., Univ. of Debrecen, Debrecen, Hungary
fDate :
Oct. 27 2012-Nov. 3 2012
Abstract :
The concept of implementing Positron Emission Tomography and Magnetic Resonance Imaging in a dual modality imaging system gained high scientific importance recently. SiPM photo detectors became a solution for operation in high magnetic fields instead of the conventional photomultipliers. The method of Anger logics in the SiPM readout of pixelated scintillator crystals would produce significant noise in the readout signals, while single channel readout for each crystal pixel would not be cost effective. Another solution could be defined if we sum the SiPM signals for each row and column and an appropriate algorithm may select the X and Y coordinates of the original position of the scintillation source. It is expected that the highest signal related row and column would indicate correct position. The scope of this work was to calculate the optimal light distribution for different SiPM and scintillator matrix geometries, that would result in the greatest signal difference between the primary and adjacent readout channels and therefore would perform the best reliable selection of the relevant row and column indices.
Keywords :
magnetic resonance imaging; photomultipliers; positron emission tomography; scintillation counters; silicon radiation detectors; Anger logics method; SiPM arrays; SiPM matrix geometry; SiPM photo; SiPM readout; SiPM signals; YSO crystal matrix; conventional photomultipliers; crystal pixel; dual modality imaging system; magnetic resonance imaging; pixelated scintillator crystals; positron emission tomography; readout scheme; readout signals; scintillation source; scintillator matrix geometry; single channel readout;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-2028-3
DOI :
10.1109/NSSMIC.2012.6551608