ESD source modeling in FDTD

Author

Rizvi, Mubashir ; Lo Vetri, J.

Author_Institution

Dept. of Electr. Eng., Univ. of Western Ontario, London, Ont., Canada

fYear

1994

fDate

22-26 Aug 1994

Firstpage

77

Lastpage

82

Abstract

Numerical modeling of the ESD event using the finite difference time domain (FDTD) technique is considered. Two methods of modeling an electrostatic discharge using FDTD are compared. The first consists of introducing the fields into the mesh from known analytic results in a region of the mesh which is homogeneous and letting the fields propagate towards the interaction of interest. The second consists of modeling the discharge current directly by discretizing the current density term in the Maxwell equations. The second offers obvious advantages in that the discharge can be modeled close to inhomogeneities such as circuit board traces and chip leads

Keywords

Maxwell equations; current density; electrostatic discharge; electrostatics; finite difference time-domain analysis; printed circuits; ESD source modeling; FDTD; Maxwell equations; chip leads; circuit board traces; current density; discharge current; electrostatic discharge; finite difference time domain; inhomogeneities; multilayer circuit board; numerical modeling; Current density; Electromagnetic fields; Electromagnetic propagation; Electrostatic discharge; Finite difference methods; Maxwell equations; Nonuniform electric fields; Numerical models; Printed circuits; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on

Conference_Location

Chicago, IL

Print_ISBN

0-7803-1398-4

Type

conf

DOI

10.1109/ISEMC.1994.385680

Filename

385680