Title :
ESD source modeling in FDTD
Author :
Rizvi, Mubashir ; Lo Vetri, J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Western Ontario, London, Ont., Canada
Abstract :
Numerical modeling of the ESD event using the finite difference time domain (FDTD) technique is considered. Two methods of modeling an electrostatic discharge using FDTD are compared. The first consists of introducing the fields into the mesh from known analytic results in a region of the mesh which is homogeneous and letting the fields propagate towards the interaction of interest. The second consists of modeling the discharge current directly by discretizing the current density term in the Maxwell equations. The second offers obvious advantages in that the discharge can be modeled close to inhomogeneities such as circuit board traces and chip leads
Keywords :
Maxwell equations; current density; electrostatic discharge; electrostatics; finite difference time-domain analysis; printed circuits; ESD source modeling; FDTD; Maxwell equations; chip leads; circuit board traces; current density; discharge current; electrostatic discharge; finite difference time domain; inhomogeneities; multilayer circuit board; numerical modeling; Current density; Electromagnetic fields; Electromagnetic propagation; Electrostatic discharge; Finite difference methods; Maxwell equations; Nonuniform electric fields; Numerical models; Printed circuits; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1398-4
DOI :
10.1109/ISEMC.1994.385680
