Title :
A spice model for predicting static thermal coupling between bipolar transistors
Author :
Beckrich, Helene ; Schwartzmann, Thierry ; Celi, Didier ; Zimmer, Thomas
Keywords :
Bipolar transistors; Current density; Current measurement; Electric breakdown; Electronic mail; Heating; Predictive models; SPICE; Temperature; Thermal resistance;
Conference_Titel :
Research in Microelectronics and Electronics, 2005 PhD
Print_ISBN :
0-7803-9345-7
DOI :
10.1109/RME.2005.1542940
