Title :
Dielectric breakdown due to hole avalanche in plasma polymer films
Author :
Ishii, K. ; Ohki, Y. ; Nakano, T.
Author_Institution :
Dept. of Electr. Eng., Waseda Univ., Tokyo, Japan
Abstract :
High-field conduction and dielectric breakdown characteristics of plasma-polymerized films of ethylene and trifluoromethane (PPEF) and those of ethylene (PPE) were studied. Based on experimental results on the prebreakdown current, time lag to breakdown, and thickness or electrode metal dependence on dielectric strength, it is shown that the breakdown is caused by hole avalanche and that scattering of holes by fluorine atoms results in higher dielectric strength in PPEF than in PPE
Keywords :
electric breakdown of solids; electric strength; impact ionisation; polymer films; PPE; PPEF; dielectric breakdown characteristics; dielectric strength; electrode metal dependence; ethylene; high-field conduction; hole avalanche; plasma polymer films; prebreakdown current; thickness; time lag to breakdown; trifluoromethane; Avalanche breakdown; Breakdown voltage; Dielectric breakdown; Electric breakdown; Electrodes; Gold; Plasma measurements; Plasma properties; Polymer films; Pulse measurements;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109712
