DocumentCode :
2556979
Title :
Three-Bit and Six-Bit Tunable Matching Networks with Tapered Lines
Author :
Allen, Wesley N. ; Peroulis, Dimitrios
Author_Institution :
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN
fYear :
2009
fDate :
19-21 Jan. 2009
Firstpage :
1
Lastpage :
4
Abstract :
Two tunable matching networks, one with three bits and one with six bits, are designed, fabricated and measured. The tuning elements of the networks are the Radant RMSW-100 SPST MEMS switches. These switches connect fixed line- loading capacitances to the networks. Tapered transmission lines are used instead of uniform lines in the networks. The 6-bit network exhibits two bands with bandwidths of 46% and 29% and Smith Chart coverage of at least 68%. The 3-bit network exhibits a single band with a bandwidth of 44% and a Smith Chart coverage of at least 23%. A particular load is included in the bandwidth and coverage calculations if (a) it can be matched with a reflection of less than -10 dB and (b) the S-parameters of the tunable matching network when configured to match this load satisfy |S11|2 + |S21|2 ges 0.5, i.e., its measured efficiency is higher than 50%.
Keywords :
circuit tuning; impedance matching; microstrip components; microswitches; 3-bit network; 6-bit network; Radant RMSW-100 SPST MEMS switches; S-parameters; Smith Chart coverage; dual-band tunable matching network; fixed line-loading capacitances; frequency 1.25 GHz to 2 GHz; frequency 1.4 GHz to 2.2 GHz; frequency 3 GHz to 4 GHz; microstrip lines; single-band tunable matching network; single-pole single-throw switches; six-bit tunable matching network; tapered transmission lines; three-bit tunable matching network; Bandwidth; Capacitance; Capacitors; Ceramics; Microswitches; Network topology; Radiofrequency microelectromechanical systems; Switches; Transmission lines; Tunable circuits and devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3940-9
Electronic_ISBN :
978-1-4244-2831-1
Type :
conf
DOI :
10.1109/SMIC.2009.4770492
Filename :
4770492
Link To Document :
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