DocumentCode
2557053
Title
Electrostatic Discharge - ESD
Author
Gieser, Horst ; Worley, Eugene
fYear
1998
fDate
15-15 Oct. 1998
Firstpage
94
Lastpage
96
Keywords
Biological system modeling; Breakdown voltage; Electrostatic discharge; Humans; Packaging; Protection; Semiconductor device modeling; Stress; Testing; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1998. IEEE International
Conference_Location
Lake Tahoe, CA, USA
Print_ISBN
0-7803-4881-8
Type
conf
DOI
10.1109/IRWS.1998.745377
Filename
745377
Link To Document