DocumentCode :
2557090
Title :
ESD-Protected 24 GHz LNA for Radar Applications in SiGe:C Technology
Author :
Issakov, Vadim ; Knapp, Herbert ; Wojnowski, Maciej ; Thiede, Andreas ; Simbürger, Werner ; Haider, Günter ; Maurer, Linus
Author_Institution :
Dept. of High-Freq. Electron., Univ. of Paderborn, Paderborn
fYear :
2009
fDate :
19-21 Jan. 2009
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents an ESD-protected 24 GHz single-stage differential cascode LNA in Inflneon´s B7HF200 SiGe technology. It is designed to fulfill high robustness requirements for industrial or automotive applications. Performance variation of key parameters has been analyzed in measurement over a wide range of temperatures from - 25degC to 125degC. The amplifier offers a gain of 12 dB and noise figure of 3.1 dB at the center frequency of 24 GHz. The circuit exhibits high linearity of -8.7 dBm and -1.8 dBm input-referred ldB compression point and IIP3, respectively. The LNA consumes 12.6 mA from a single 3.3 V supply. The ESD hardness has been investigated using a Transmission Line Pulse (TLP) system. The circuit exhibits minimum 1.3 A failure current on the RF pins, which corresponds to HBM protection above 1.5 kV. The chip size including the pads is 0.32 mm2.
Keywords :
Ge-Si alloys; carbon; electrostatic discharge; hardness; high-frequency transmission lines; low noise amplifiers; semiconductor materials; ESD protection; HBM protection; Inflneon´s B7HF200 SiGe technology; SiGe:C; failure current; frequency 24 GHz; hardness; high linearity; radar; single-stage differential cascode LNA; temperature -25 degC to 125 degC; transmission line pulse system; voltage 3.3 V; Automotive applications; Circuits; Gain; Germanium silicon alloys; Noise figure; Noise robustness; Performance analysis; Radar applications; Silicon germanium; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3940-9
Electronic_ISBN :
978-1-4244-2831-1
Type :
conf
DOI :
10.1109/SMIC.2009.4770497
Filename :
4770497
Link To Document :
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