Title :
Low cost process for development of electrostatically actuated optical devices using gold electroplating
Author :
Kumar, A. ; Kumar, P. ; Bansal, D. ; Rangra, K.
Author_Institution :
AcSIR (Acad. of Sci. & Innovative Res.), New Delhi, India
Abstract :
This paper presents a low cost fabrication process for development of electrostatically actuated optical microstructures. To illustrate the process - a design, fabrication and measurement iteration for digital micromirror test structures is presented. The structures are fabricated on Single Crystal Silicon wafer using surface micromachining and gold electroplating. The major focus of the work has been on the process compatibility with conventional CMOS fabrication technology, lower cost, complexity, lower surface roughness and susceptibility of compliant structures to thermal cycling during the process. The structures consist of 1-2 micron thick micromirrors suspended at a height of 2-5 micron and surface roughness of 22-30 nm. Vertical deflection (3 micron), pull-in voltage (31V) and mechanical resonance frequency (25 KHz) match within 5-10% to the simulated design. The approach can be extended to realize optical switches, light modulators, grating structures, barcode readers and optical scanners.
Keywords :
CMOS integrated circuits; crystal microstructure; electroplating; electrostatic actuators; elemental semiconductors; gold; micromachining; micromirrors; optical fabrication; optical susceptibility; silicon; surface roughness; Au; CMOS fabrication technology; Si; compliant structures susceptibility; digital micromirror test structures; electrostatically actuated optical devices; electrostatically actuated optical microstructures; frequency 25 kHz; gold electroplating; low cost fabrication process; measurement iteration; mechanical resonance frequency; micromirrors; pull-in voltage; single crystal silicon wafer; size 1 micron to 2 micron; surface micromachining; surface roughness; thermal cycling; vertical deflection; voltage 31 V; Fabrication; Gold; Micromirrors; Rough surfaces; Surface roughness; Surface treatment; Critical Point Dryer (CPD); Electroplating; MEMS; Micromachining; Sacrificial layer;
Conference_Titel :
India Conference (INDICON), 2014 Annual IEEE
Conference_Location :
Pune
Print_ISBN :
978-1-4799-5362-2
DOI :
10.1109/INDICON.2014.7030605