DocumentCode :
2557329
Title :
Enhancement of SiGe HBT Linearity Characteristics with Current Source Bias
Author :
Qin, Guoxuan ; Wang, Guogong ; Ma, Zhenqiang
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI
fYear :
2009
fDate :
19-21 Jan. 2009
Firstpage :
1
Lastpage :
4
Abstract :
Linearity characteristics in terms of two-tone third order intermodulation distortion (IMD3) for common-emitter (CE) SiGe heterojunction bipolar transistors (HBT) are investigated at high frequency (6 GHz) with impedance matched for maximum output power. An approach to enhancing the linearity of SiGe HBTs at their high input power levels through the use of current bias instead of voltage bias is presented for the first time. Both measurements and simulations show that SiGe HBT linearity under high input power level (severe gain compression) can be improved. The reasons responsible for the linearity enhancement are discussed.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; impedance matching; semiconductor device models; semiconductor materials; HBT linearity characteristics; SiGe; common-emitter heterojunction bipolar transistors; current source bias; frequency 6 GHz; gain compression; impedance matching; input power levels; output power; two-tone third order intermodulation distortion; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Impedance matching; Intermodulation distortion; Linearity; Power generation; Power measurement; Silicon germanium; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3940-9
Electronic_ISBN :
978-1-4244-2831-1
Type :
conf
DOI :
10.1109/SMIC.2009.4770506
Filename :
4770506
Link To Document :
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