• DocumentCode
    2557428
  • Title

    The EFI test method for accelerated growth of water trees

  • Author

    Faremo, H. ; Ildstad, E.

  • Author_Institution
    Norwegian Electr. Power Res. Inst., Trondheim, Norway
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    191
  • Lastpage
    194
  • Abstract
    The philosophy behind the development of Rogowski-type test objects and the aging and test procedures used in the Norwegian Electric Power Research Institute (EFI) test method are presented. Some of the results obtained during almost eight years of the use of this method are briefly reviewed. The great advantage of the method is that a model of a cable insulation system consisting of semiconducting screens and extruded insulating materials can be tested. After production, the test objects are screened in a high-voltage test (50 kV/mm) in order to exclude production errors. After aging, water tree analysis and breakdown tests can be performed on the same test objects. The effect of differing aging conditions and materials on water treeing and breakdown strength can easily be determined. The objects are manufactured from extruded insulation tapes. The EFI test method has been demonstrated to be well correlated with cable test results provided the same batch of materials is used for comparison
  • Keywords
    ageing; cable insulation; electric breakdown of solids; insulation testing; EFI test method; Norwegian Electric Power Research Institute; Rogowski-type test objects; accelerated growth; aging; breakdown strength; breakdown tests; cable insulation system; cable test results; extruded insulating materials; high-voltage test; production errors; semiconducting screens; test procedures; water tree analysis; water trees; Aging; Cable insulation; Electric breakdown; Life estimation; Materials testing; Power system modeling; Production; Semiconductivity; Semiconductor materials; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1990.109738
  • Filename
    109738