DocumentCode :
2557510
Title :
Combining blind source analysis and Elman recurrent neural network to determine overlapping voltammograms
Author :
Gao, Ling ; Ren, Shouxin
Author_Institution :
Dept. of Chem., Inner Mongolia Univ., Huhhot, China
fYear :
2012
fDate :
29-31 May 2012
Firstpage :
335
Lastpage :
339
Abstract :
A novel method named ICA-ERNN approach based on independent component analysis (ICA) as pre-processed tool with Elman recurrent neural network (ERNN) regression was proposed for the simultaneous differential pulse voltammetric determination of o-nitroaniline, m-nitroaniline and p-nitroaniline with overlapping peaks. The method combines the ideas of ICA with ERNN regression for enhancing the ability in the extraction of characteristic information and the quality of regression. A program (PICAERNN) was designed to perform the simultaneous voltammetric determination of o-nitroaniline, m-nitroaniline and p-nitroaniline. The relative standard errors of prediction (RSEP) obtained for all components using ICA-ERNN and ERNN were compared. Experimental results demonstrated that the ICA-ERNN method had better result than ERNN methods and was successful even when there was severe overlap of voltammgrams.
Keywords :
blind source separation; chemistry computing; feature extraction; independent component analysis; organic compounds; recurrent neural nets; regression analysis; voltammetry (chemical analysis); ERNN regression; Elman recurrent neural network; ICA-ERNN approach; PICAERNN program; blind source analysis; characteristic information extraction; independent component analysis; m-nitroaniline; o-nitroaniline; overlapping voltammogram determination; p-nitroaniline; relative standard errors of prediction; simultaneous differential pulse voltammetric determination; Artificial neural networks; Context; Independent component analysis; Matrix decomposition; Recurrent neural networks; Standards; Training; Elman recurrent neural network; blind source separation; multicomponent determination; nitroaniline isomers; overlapping voltammograms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Natural Computation (ICNC), 2012 Eighth International Conference on
Conference_Location :
Chongqing
ISSN :
2157-9555
Print_ISBN :
978-1-4577-2130-4
Type :
conf
DOI :
10.1109/ICNC.2012.6234574
Filename :
6234574
Link To Document :
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