DocumentCode :
2557727
Title :
HB-based CAD-oriented dynamic stability analysis of circuits and devices: Application to the assessment of thermal instabilities in multifinger HBTs
Author :
Traversa, F.L. ; Cappelluti, F. ; Bonani, F. ; Ghione, G.
Author_Institution :
Dipt. di Elettron., Politec. di Torino, Torino, Italy
fYear :
2009
fDate :
7-12 June 2009
Firstpage :
1493
Lastpage :
1496
Abstract :
We present a novel CAD-oriented approach to the analysis of thermal instabilities in power HBTs. The stability analysis is carried out in time-periodic dynamic conditions, by calculating the Floquet multipliers of the limit cycle representing the HBT working point. Such a computation is performed directly in the frequency domain, one the sole basis of the Jacobian of the harmonic balance problem yielding the limit cycle. The corresponding stability assessment is therefore rigorous, and the efficient calculation method makes it readily implementable in CAD tools allowing for circuit and device optimization. Results on 3- and 4-finger layouts are shown, including the assessment of popular stabilization techniques such as emitter ballasting and thermal shunt, thus demonstrating the possible use of the approach as an optimization tool.
Keywords :
circuit CAD; circuit analysis computing; heterojunction bipolar transistors; power engineering computing; power transistors; thermal stability; Floquet multipliers; HB-based CAD-oriented analysis; dynamic stability analysis; emitter ballasting; harmonic balance problem; multifinger HBT; power HBT; thermal instabilities; thermal shunt; time-periodic dynamic conditions; Circuit stability; Design automation; Design optimization; Electronic ballasts; Frequency domain analysis; Heterojunction bipolar transistors; Limit-cycles; Nonlinear dynamical systems; Performance analysis; Stability analysis; Electrothermal effects; Heterojunction bipolar transistors; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location :
Boston, MA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-2803-8
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2009.5165991
Filename :
5165991
Link To Document :
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