DocumentCode :
2557864
Title :
Wavelength and polarization effects in actively tunable thin film resonators for thermal drift compensation
Author :
Metz, P. ; Krantz, M.C. ; Gerken, M.
Author_Institution :
Integrated Syst. & Photonics, Christian-Albrechts-Univ. zu Kiel, Kiel, Germany
fYear :
2011
fDate :
26-30 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
Thin film resonators produce significant beam shifts of incident light based on incidence angle and wavelength dependent changes of the effective group propagation angle. We investigate these shifts in actively tunable resonators for thermal drift compensation in transparent free-space optical interconnect networks for future inter- and intra-chip applications. The effects of VCSEL wavelength variations, WDM tuning range, and polarization fluctuations on system performance are analyzed.
Keywords :
light polarisation; light propagation; optical interconnections; optical resonators; surface emitting lasers; thin films; wavelength division multiplexing; VCSEL wavelength variations; WDM tuning range; actively tunable resonators; beam shifts; group propagation angle; incidence angle; incident light; polarization effects; polarization fluctuations; thermal drift compensation; thin film resonators; transparent free-space optical interconnect networks; wavelength effects; Optical interconnections; Optical resonators; Optical waveguides; Reflectivity; Temperature measurement; Tuning; Vertical cavity surface emitting lasers; optical interconnects; spatial dispersion; superprism; thermal drift compensation; thin film filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks (ICTON), 2011 13th International Conference on
Conference_Location :
Stockholm
ISSN :
2161-2056
Print_ISBN :
978-1-4577-0881-7
Electronic_ISBN :
2161-2056
Type :
conf
DOI :
10.1109/ICTON.2011.5970852
Filename :
5970852
Link To Document :
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