Title :
New very low frequency methods for testing extruded cables
Author :
Krüger, Michael ; Feurstein, R. ; Filz, A.
Author_Institution :
BAUR Pruf und Messtech., Sulz, Austria
Abstract :
A novel digital instrument has been developed for loss-factor measurement. It is program controlled, easy to operate, and has a measurement resolution of tan δ-0.1 Hz=0.01%. The loss angle is determined by a range measurement of crossovers of current and voltage. At 0.1 Hz tan δ has a considerably larger dynamic than at 50 Hz; for this reason tan δ-0.1 Hz is especially suitable for diagnostics of the operational efficiency of plastic cables. Measurements on naturally aged cables showed that there is a definite correlation between increased tan δ-0.1 Hz and reduced breakdown voltage. The tan δ-0.1 Hz measurement carried out at a nominal voltage U0 allows nondestructive evaluation if the cable has been damaged by long water trees. With a 0.1-Hz test at 3U 0 for approximately 1 h, serious weak points can be detected in the plastic insulation
Keywords :
cable insulation; cable testing; dielectric loss measurement; digital instrumentation; electric strength; insulation testing; maintenance engineering; organic insulating materials; polymers; power cables; signal generators; 0.1 Hz; 1 h; HV cables; XLPE cables; diagnostics; digital instrument; installed underground cable testing; long cables testing; long water trees; loss-factor measurement; measurement of crossovers of current; measurement resolution; naturally aged cables; nominal voltage; nondestructive evaluation; operational efficiency of plastic cables; plastic insulation; polyethylene cables; program controlled; reduced breakdown voltage; sinusoidal AC voltage; testing extruded cables; very low frequency methods; weak points; Aging; Cables; Current measurement; Frequency; Instruments; Loss measurement; Plastics; Testing; Trees - insulation; Voltage;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109757