DocumentCode :
2557901
Title :
Characterization of breakdown delay and memory effects in high power microwave dielectric window discharges
Author :
Kupczyk, Brian ; Xiang, Xun ; Scharer, John ; Booske, John
Author_Institution :
Department of Electrical and Computer Engineering, University of Wisconsin - Madison, USA, 53706
fYear :
2012
fDate :
8-13 July 2012
Abstract :
Summary form only given. Development of high power microwave (HPM) distributed discharge limiters relies critically on minimizing the delay time between HPM incidence and diffuse plasma creation. We present a series of pulsed plasma experiments conducted in neon, argon, and a 9∶1 mixture of the two gases from 50–760 torr. Breakdown is achieved by illuminating a gas cell with a train of ∼25kW, ∼2 kV/cm, 800ns-long pulses at 41Hz repetition rate. The results suggest that surface charge accumulation on the gas cell´s polycarbonate window from many low density precursor discharges eventually results in rapid (<30ns), high density, discharge formation. The number of precursor pulses required to form these high density discharges is significantly reduced following a previous high-density discharge.
Keywords :
Argon; Delay; Discharges (electric); Microwave circuits; Plasmas; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location :
Edinburgh
ISSN :
0730-9244
Print_ISBN :
978-1-4577-2127-4
Electronic_ISBN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2012.6383530
Filename :
6383530
Link To Document :
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