DocumentCode :
2557937
Title :
High Temperature DC and RF Behavior of Partially Depleted SOI versus Deep n-Well Protected Bulk MOSFETs
Author :
Emam, M. ; Vanhoenacker-Janvier, D. ; Raskin, J. -P
Author_Institution :
Microwave Lab., Univ. Catholique de Louvain, Louvain-la-Neuve
fYear :
2009
fDate :
19-21 Jan. 2009
Firstpage :
1
Lastpage :
4
Abstract :
The introduction of deep n-well protection for bulk MOS transistors can highly enhance their DC and RF performance. It also gives the advantage of having floating-body and body-tied structures in bulk MOSFETs while eliminating the disadvantages related to the shift in performance between these two structures. We demonstrate that the high temperature, DC and RF performance of n-well isolated bulk MOSFETs are really competitive compared to the state-of-the-art Partially Depleted SOI MOS technology.
Keywords :
MOSFET; elemental semiconductors; microwave devices; silicon; silicon-on-insulator; DC performance; RF performance; Si; body-tied structures; bulk MOSFET; deep n-well protection; floating-body structures; partially depleted SOI; CMOS technology; Capacitance; Isolation technology; Leakage current; MOSFETs; Protection; Radio frequency; Silicon on insulator technology; Switches; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3940-9
Electronic_ISBN :
978-1-4244-2831-1
Type :
conf
DOI :
10.1109/SMIC.2009.4770530
Filename :
4770530
Link To Document :
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