• DocumentCode
    2557999
  • Title

    Validity Analysis of the Near-Field Equivalent Method in Simulation

  • Author

    Liu, Yang ; Chen Ai-xin ; Yang Liu ; Zhang Yan-jun

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • fYear
    2010
  • fDate
    23-25 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, the validity of the near-field equivalent method is studied to solve the problem of distortion in simulations. To analyze the validity, the condition of the principle of equivalence is reconsidered. The relationship between the principle of equivalence and the methods of near-field equivalence and far-field equivalence is studied, results show that the distance between the antenna and its platform is the key factor affecting the validity. To verify it, the 2D radiation patterns of the three-knife antenna above the curved platform are analyzed with full modeling simulation method and near-field equivalent method, respectively. Results indicate that the near-field equivalent method can still be used to simulate the radiation patterns of antennas above the platform, but the accuracy of this method is closely related to the distance between the antenna and its platform. That is, the longer the distance is, the more accurate the results are; when the distance is longer than 1/3 wavelength, high-precision results can be achieved with near-field equivalent method; However, when the distance is shorter than about 1/30 wavelength, this method is no longer appropriate for the simulation.
  • Keywords
    antenna radiation patterns; 2D radiation patterns; far-field equivalence; near-field equivalent method; three-knife antenna; validity analysis; Analytical models; Antenna radiation patterns; Aperture antennas; Computational modeling; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications Networking and Mobile Computing (WiCOM), 2010 6th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-3708-5
  • Electronic_ISBN
    978-1-4244-3709-2
  • Type

    conf

  • DOI
    10.1109/WICOM.2010.5600859
  • Filename
    5600859