Title :
Built-in self-test mode in a multi-path feedforward compensated operational amplifier
Author :
Kejariwal, Murari ; Ammisetti, Prasad ; Melanson, John
Author_Institution :
Cirrus Logic, Inc., Austin, TX
Abstract :
A non-invasive methodology of built-in self-test (BIST) has been presented for analog integrated circuits where there are no pins dedicated to introduce test modes or monitor BIST mode results. In this application BIST signature is binary coded to isolate the fault location precisely. This technique is successfully implemented in a 5-stage multi-path feed forward operational amplifier in a standard package when no dedicated pin is available for inducing or monitoring BIST. The implementation uses a calibration phase which makes this technique process variation tolerant
Keywords :
analogue integrated circuits; binary codes; built-in self test; fault location; feedforward amplifiers; integrated circuit testing; operational amplifiers; analog integrated circuits; binary code; built-in self test mode; calibration phase; fault location; multipath feedforward operational amplifier; noninvasive methodology; Analog integrated circuits; Automatic testing; Built-in self-test; Circuit testing; Fault location; Feeds; Integrated circuit testing; Monitoring; Operational amplifiers; Pins;
Conference_Titel :
Circuits and Systems, 2006. ISCAS 2006. Proceedings. 2006 IEEE International Symposium on
Conference_Location :
Island of Kos
Print_ISBN :
0-7803-9389-9
DOI :
10.1109/ISCAS.2006.1693941
