Negative charging and secondary emission of Teflon FEP under electron irradiation

Author

Berraissoul, A. ; Gross, B.

Author_Institution

Inst. for Electroacoust., Tech. Univ. of Darmstadt, West Germany

fYear

1988

fDate

1-3 Sep 1988

Firstpage

364

Lastpage

368

Abstract

One-side-metallized Teflon FEP films of 25-μm thickness were irradiated on the nonmetallized side with electron beams of energy above that of the second crossover point E_II. E _II is the energy at which the number of emitted secondary electrons equals the number of incident primaries. For a beam energy E_b=12 keV, the sample surfaces reaches a potential of V_s=10.5 kV, corresponding to E_II=1.5 keV. Due to this charging, the effective energy of the incident electrons decreases. Measurements of the currents induced in the rear electrode allow this secondary-emission yield to be determined as a function of energy. Results are compared with data published by other authors and are represented by an approximate relation

Keywords

polymer films; secondary electron emission; static electrification; surface potential; Teflon FEP; electron irradiation; films; negative charging; potential; secondary emission; Backscatter; Chemistry; Current measurement; Electrodes; Electron beams; Electron emission; Energy measurement; Physics; Surface charging; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1988. (ISE 6) Proceedings., 6th International Symposium on (IEEE Cat. No.88CH2593-2)

Conference_Location

Oxford

Type

conf

DOI

10.1109/ISE.1988.38581

Filename

38581