DocumentCode
2558213
Title
AM/PM Nonlinearities in SiGe HBTs
Author
Horst, Stephen ; Cressler, John D.
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear
2009
fDate
19-21 Jan. 2009
Firstpage
1
Lastpage
4
Abstract
An analysis of AM/PM nonlinear distortion in advanced SiGe HBTs is presented. The results show that an optimum bias point exists in the high-injection collector current density regime as the device nears BVCEO. At this point, the phase deviation remains close to zero, even as the transistor gain goes into compression. This effect can be further optimized by matching the output of the device to its optimum OIP3 impedance. These results should prove useful for power amplifier design for high data rate electronic systems, which typically require high peak-to-average power ratios.
Keywords
Ge-Si alloys; heterojunction bipolar transistors; intermodulation distortion; nonlinear distortion; AM/PM nonlinear distortion; HBT; SiGe; heterojunction bipolar transistors; high data rate electronic systems; high-injection collector current density regime; intermodulation distortion; optimum bias point; peak-to-average power ratio; power amplifier design; Degradation; Distortion measurement; Germanium silicon alloys; Linearity; Phase distortion; Phase measurement; Signal generators; Silicon germanium; Tuners; Wireless LAN;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Monolithic Integrated Circuits in RF Systems, 2009. SiRF '09. IEEE Topical Meeting on
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-3940-9
Electronic_ISBN
978-1-4244-2831-1
Type
conf
DOI
10.1109/SMIC.2009.4770544
Filename
4770544
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