• DocumentCode
    2558556
  • Title

    High-bandwidth measurement of low-level prebreakdown currents in liquid dielectrics

  • Author

    Wintenberg, A.L. ; Blalock, T.V. ; Pace, M.O.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tennessee Univ., Knoxville, TN, USA
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    422
  • Lastpage
    426
  • Abstract
    The development of a measurement system optimized for making low-noise, high-bandwidth measurements of prebreakdown currents in liquid dielectrics under DC stress is described. The system consists of a 90-MHz bandwidth transimpedance amplifier with a 5000-V/A gain, two wideband buffer amplifiers, a 200-Msample/s transient digitizer, and waveform reconstruction software. The system has an overall bandwidth of 65 MHz, including the digitizer, and a minimum detectable current of 300 nA for a signal-to-RMS noise ratio of five. Waveform reconstruction software is used to quadruple the effective sampling rate from 5 ns per point to 1.25 ns per point. Initial experimental results from the use of this measurement system are presented. Prebreakdown currents were measured in hexane using a point-plane electrode geometry with the needle connected to the preamplifier input and either positive or negative high voltage applied to the plane. Pulses with extremely short durations (<8 ns full width at half-maximum amplitude) and amplitudes ranging from tens of microamperes down to near the noise level of the measurement system were observed. The usual pulse shape appears to be the system impulse response, which implies that the current pulses are very fast indeed
  • Keywords
    computerised instrumentation; electric breakdown of liquids; electric current measurement; organic compounds; waveform analysis; 300 nA; 65 MHz; 90 MHz; DC stress; hexane; high-bandwidth measurements; liquid dielectrics; low-level prebreakdown currents; measurement system; minimum detectable current; point-plane electrode geometry; preamplifier input; pulse shape; sampling rate; signal-to-RMS noise ratio; transient digitizer; transimpedance amplifier; waveform reconstruction software; wideband buffer amplifiers; Bandwidth; Broadband amplifiers; Current measurement; Dielectric liquids; Dielectric measurements; Pulse measurements; Pulse shaping methods; Sampling methods; Signal to noise ratio; Stress measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1990.109787
  • Filename
    109787