DocumentCode
2558612
Title
Development of a multi-pinhole brain SPECT system with CdZnTe semiconductor detectors
Author
Donai, Takanori ; Ogawa, Koichi ; Nyui, Yoshiyuki ; Fukushi, Masaru
Author_Institution
Grad. Sch. of Eng., Hosei Univ., Tokyo, Japan
fYear
2012
fDate
Oct. 27 2012-Nov. 3 2012
Firstpage
3134
Lastpage
3137
Abstract
The purpose of our research is to develop a new brain single photon emission CT (SPECT) system with semiconductor detectors. The gamma camera with semiconductor detectors with multi-pinhole enables us to make a compact brain SPECT system. In this paper we evaluated the performance of the proposed data acquisition system by simulations in terms of the number of data acquisition angles including the wobbling of the gantry with pinhole collimators. Moreover, we developed a prototype system with three semiconductor detector units to evaluate the proposed method experimentally. In this system, we used three pinhole collimators on the three surfaces of the hexagonal gantry around a targeted object. In front of three surfaces with pinhole collimators, we located three detector units that consisted of ten (5 × 2) CdZnTe modules. The size of a module was 39 × 39 mm2 (16 × 16 pixels) and the thickness of the CdZnTe crystal was 5 mm. The results obtained with the simulations confirmed the validity of the proposed brain SPECT system. And the results of the preliminary experiment validated our proposed system.
Keywords
biomedical equipment; brain; cadmium compounds; prototypes; semiconductor counters; single photon emission computed tomography; CdZnTe; CdZnTe crystal size; CdZnTe semiconductor detector; compact brain SPECT system; data acquisition angle; data acquisition system simulation; experimental result; gamma camera; gantry wobbling; hexagonal gantry; module size; multipinhole brain SPECT system; prototype system; single photon emission CT system; size 39 mm; size 5 mm; targeted object; three detector unit; three pinhole collimator;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
978-1-4673-2028-3
Type
conf
DOI
10.1109/NSSMIC.2012.6551715
Filename
6551715
Link To Document