Title :
Catalytic decomposition of S2F10 and its implications on sampling and detection from SF6-insulated equipment
Author :
Olthoff, J.K. ; Van Brunt, R.J. ; Herron, J.T. ; Sauers, I. ; Harman, G.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
The authors report the first results of a study investigating the mechanisms and rates of surface decomposition of S2F10 under various conditions. The results of this study indicate that the decomposition of S2F10 in standard sample cylinders is a problem in any attempt to determine the presence of S2F10 in SF6-insulated equipment. It is shown that surface decomposition rates on stainless steel increase with increased water content, temperature, and surface-to-volume ratio, and with decreased gas pressure. The implications of these results for the preparation and storage of S2F10 samples are discussed. Additionally, the use of this surface decomposition mechanism to enhance the detection sensitivity of small concentrations of S2 F10 in SF6 using a gas chromatograph/mass spectrometer (GC/MS) is investigated. Detection sensitivities of 1 p.p.m. by volume of S2F10 in SF6 are routinely achievable using this technique
Keywords :
catalysis; chromatography; gaseous insulation; health hazards; mass spectroscopic chemical analysis; safety; sulphur compounds; FeCrC; GC/MS; S2F10-SF6; catalytic decomposition; catalytic decomposition of S2F10; decreased gas pressure; detection sensitivity; gas chromatograph/mass spectrometer; implications on sampling; small concentrations of S2F10 in SF6 ; stainless steel; standard sample cylinders; surface decomposition mechanism; surface decomposition rates; surface-to-volume ratio; temperature; toxicity; water content; Gas insulation; Helium; Laboratories; Mass spectroscopy; Monitoring; NIST; Sampling methods; Steel; Temperature sensors; Thermal conductivity;
Conference_Titel :
Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
Conference_Location :
Toronto, Ont.
DOI :
10.1109/ELINSL.1990.109799