Title :
Squeeze-film damping in solid-state accelerometers
Author_Institution :
Honeywell Inc., Plymouth, MN, USA
Abstract :
Criteria are set forth that are aimed at altering the designer to the onset of nonlinear and compressible effects in accelerometers. A finite-element technique is presented that essentially solves Reynold´s equation for small displacements and squeeze numbers by analogy with heat conduction in a solid with internal heat generation. Examples are presented that show film pressure profiles generated for complex geometries with nonuniform film thicknesses and squeeze velocities. A technique for mitigation of compressibility effects through film pressurization is suggested. Ideal damping results if both the squeeze number and the relative displacement are kept much less than 1.0. If these conditions are satisfied, one can then use finite-element techniques to estimate damping coefficients for other than simple geometries.<>
Keywords :
accelerometers; finite element analysis; Reynold´s equation; complex geometries; compressible effects; damping; film pressure profiles; finite-element technique; nonlinear effects; solid-state accelerometers; squeeze numbers; Accelerometers; Damping; Finite element methods; Frequency; Geometry; Shock absorbers; Silicon; Solid state circuits; Temperature dependence; Viscosity;
Conference_Titel :
Solid-State Sensor and Actuator Workshop, 1990. 4th Technical Digest., IEEE
Conference_Location :
Hilton Head Island, SC, USA
DOI :
10.1109/SOLSEN.1990.109817