• DocumentCode
    2559210
  • Title

    Technology roadmap for 22nm and beyond

  • Author

    Iwai, Hiroshi

  • Author_Institution
    Frontier Res. Canter, Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2009
  • fDate
    1-2 June 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Logic CMOS technology roadmap for dasia22 nm and beyondpsila is described with ITRS (International Technology Roadmap for Semiconductor) as a reference. In the ITRS 2008 Update published just recently, there has been some significant change in the trend of the gate length. The predicted trend has been amended to be less aggressive from the ITRS 2008 Update, resulting in the delay in the gate-length shrinkage for 3 years in the short term and 5 years in the long term from those predicted in ITRS 2007. Regarding the downsize limit, it would take probably 20 to 30 years until we reach the final limit, because the duration between the generations will become longer when approaching the limit. In order to suppress the off-leakage current, double gate (DG) or fin-FET type MOSFETs are the most promising. Then, it is a natural extension for DG FETs to evolve to Si-nanowire MOSFETs as the ultimate structure of transistors for CMOS circuit applications. Si-nanowire FETs are more attractive than the conventional DG FETs because of higher on-current conduction due to their quantum nature and also because of their adoptability for high-density integration including that of 3D. Then, what will come next after reaching the final limit of the downsizing? The answer is new algorithm. In the latter half of this century, the application of algorithm used for the natural bio system will make the integrated circuits operation tremendously high efficiency. Much higher performance with ultimately low power consumption will be realized.
  • Keywords
    CMOS logic circuits; MOSFET; CMOS circuit; ITRS 2008 Update; Si-nanowire MOSFET; double gate MOSFET; downsize limit; fin-FET type MOSFET; gate-length shrinkage; integrated circuits; logic CMOS technology roadmap; off-leakage current; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Delay; Electron devices; Energy consumption; FETs; Lithography; Logic devices; MOSFETs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Semiconductor Technology, 2009. IEDST '09. 2nd International Workshop on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4244-3831-0
  • Electronic_ISBN
    978-1-4244-3832-7
  • Type

    conf

  • DOI
    10.1109/EDST.2009.5166100
  • Filename
    5166100