DocumentCode :
2559314
Title :
Subpicosecond laser breakdown in optical thin films
Author :
Emmert, L.A. ; Nguyen, D.N. ; Rudolph, W.
Author_Institution :
Dept. of Phys., Univ. of New Mexico, Albuquerque, NM, USA
fYear :
2011
fDate :
26-30 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
Experimental and theoretical progress on subpicosecond laser pulse breakdown in dielectric films is reviewed. The single pulse threshold fluences can be related to fundamental material properties and scaling laws with respect to pulse duration and material bandgap are discussed. Multiple pulse thresholds are controlled by native and laser-induced defects. A phenomenological model is introduced that describes the accumulation and relaxation of such defects. The model is able to explain the experiments and can be used to assess relevant defect parameters. Experimental results are presented that exemplify how the ambient atmosphere affects the multiple pulse laser damage thresholds.
Keywords :
dielectric thin films; energy gap; laser beam effects; laser materials processing; optical films; defect parameters; dielectric films; laser-induced defects; material bandgap; multiple pulse laser damage thresholds; optical thin films; phenomenological model; pulse duration; scaling laws; subpicosecond laser pulse breakdown; Electric breakdown; Films; Laser excitation; Laser modes; Measurement by laser beam; Photonic band gap; dielectric thin films; femtosecond laser pulses; optical coatings;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks (ICTON), 2011 13th International Conference on
Conference_Location :
Stockholm
ISSN :
2161-2056
Print_ISBN :
978-1-4577-0881-7
Electronic_ISBN :
2161-2056
Type :
conf
DOI :
10.1109/ICTON.2011.5970921
Filename :
5970921
Link To Document :
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