• DocumentCode
    2559361
  • Title

    Count-Regulated OSEM reconstruction

  • Author

    Vaissier, Pieter E. B. ; Goorden, Marlies C. ; Taylor, Aaron B. ; Beekman, Freek J.

  • Author_Institution
    Sect. Radiat. Detection & Med. Imaging, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    3315
  • Lastpage
    3320
  • Abstract
    Block-iterative algorithms such as OSEM are widely used to accelerate tomographic image reconstruction in e.g. SPECT or PET. The speed-up factor of OSEM over MLEM is close to the number of subsets (NS). Significant additional speedup is achievable with novel pixel-based subset choices. However, a high NS can lead to undesirable noise amplification and unacceptable disappearance of activity. Here we introduce Count-Regulated OSEM (CROSEM): Given a maximum NS (NSmax), CROSEM automatically determines the voxel-wise reduction of the NS in low-activity voxels based on the estimated number of counts that originate from each voxel. CROSEM was compared to MLEM and OSEM for high-resolution multi-pinhole SPECT. SPECT simulations showed that for NSmax=128, CROSEM attained speed-up factors close to 128 in high-activity image regions and kept quantitative accuracy in low-activity regions comparable to MLEM. OSEM showed increasing quantification errors for an increasing NS. At equal contrast in high-activity regions, CROSEM exhibited lower noise in low-activity regions than MLEM.
  • Keywords
    image reconstruction; image resolution; iterative methods; medical image processing; noise; positron emission tomography; single photon emission computed tomography; CROSEM; MLEM; PET; accelerate tomographic image reconstruction; block-iterative algorithm; count-regulated OSEM; count-regulated OSEM reconstruction; high-resolution multipinhole SPECT; noise amplification; speed-up factor; voxel-wise reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551755
  • Filename
    6551755