Title :
CHAN: An efficient critical path analysis algorithm
Author :
Chang, Hoon ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Univ. of Texas, Austin, TX, USA
Abstract :
An efficient critical path analysis algorithm (CHAN) based on the automatic test pattern generation (ATPG) method PODEM is presented. The approach does not require generation of the path list and elimination of false paths, and the critical path of the circuit is found accurately. In CHAN, the limitations of conventional approaches are overcome, and the critical path is detected in vastly improved times in most cases considered
Keywords :
VLSI; circuit CAD; circuit analysis computing; critical path analysis; integrated circuit design; logic CAD; logic testing; timing; CHAN; PODEM; VLSI circuits; automatic test pattern generation; efficient critical path analysis algorithm; timing verification; Algorithm design and analysis; Automatic test pattern generation; Circuit analysis; Circuit testing; Clocks; Delay estimation; Jacobian matrices; SPICE; Timing; Very large scale integration;
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
DOI :
10.1109/EDAC.1993.386435
