DocumentCode :
2560027
Title :
Machine grouping algorithm for stepper back-up and an empirical study
Author :
Hsu, Chia-Yu ; Chien, Chen-Fu ; Tsao, Yung-Chen ; Li, Cheng-Yi
Author_Institution :
Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu
fYear :
2004
fDate :
10-10 Sept. 2004
Firstpage :
170
Lastpage :
173
Abstract :
Considering the limitations of the operation cost and the flexibility need of the manufacturing, the wafer was unable to expose in the same stepper from layer to layer in the real setting. In addition, the lithographic systems also require appreciate back-ups to avoid the yield loss as the equipment fault or shut-down for maintenance. This study aims to develop a machine group algorithm for the stepper and thus propose appropriate back-up based on the similarity of systematic overlay errors and residuals. The results are confirmed with judgments of domain experts and thus validated this approach
Keywords :
flexible manufacturing systems; integrated circuit yield; photolithography; semiconductor device manufacture; equipment fault; lithographic system; machine grouping algorithm; operation cost; photolithography; semiconductor manufacturing; stepper back-up; Costs; Error correction; Industrial engineering; Laboratories; Lenses; Lithography; Manufacturing industries; Manufacturing processes; Research and development management; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Technology Workshop Proceedings, 2004
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-8469-5
Type :
conf
DOI :
10.1109/SMTW.2004.1393757
Filename :
1393757
Link To Document :
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