Title :
Cross-talk extraction from mask layout
Author :
Sicard, E. ; Demonchaux, T. ; Noullet, J.L. ; Rubio, A.
Author_Institution :
INSAS-DGE, Toulouse, France
Abstract :
The principles of an automated cross-talk extractor from the mask-level description of a CMOS integrated circuit are detailed. The physical extraction principles, the techniques for parasitic coupling evaluation and modeling, the technique for back-annotating the schematic diagram of the integrated circuit are presented. A model for mixed-level simulation is proposed, covering various parasitic effects of the cross-talk phenomenon. The efficiency of the cross-talk extractor is demonstrated through the analysis of mixed digital/analog CMOS integrated circuits where critical couplings are predicted and eliminated
Keywords :
CMOS integrated circuits; circuit analysis computing; circuit layout CAD; crosstalk; integrated circuit interconnections; integrated circuit modelling; mixed analogue-digital integrated circuits; CMOS integrated circuit; automated crosstalk extractor; back-annotating; critical couplings; mask layout; mask-level description; mixed digital/analog CMOS; mixed-level simulation; model; parasitic coupling evaluation; schematic diagram; CMOS integrated circuits; CMOS technology; Capacitors; Coupling circuits; Crosstalk; Integrated circuit modeling; Integrated circuit noise; Semiconductor device modeling; Space technology; Wires;
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
DOI :
10.1109/EDAC.1993.386440
