DocumentCode
2560210
Title
Electro-negative plasma diagnostic using pulse bias hairpin probe
Author
Sirse, N. ; Karkari, S.K. ; Turner, M.M.
Author_Institution
LPP, Ecole Polytech., Palaiseau, France
fYear
2012
fDate
8-13 July 2012
Abstract
Electro-negative plasmas are widely used in plasma processing, ion source for neutral beam heating in fusion devices, plasma etching and ion Hall thrusters. Presence of negative ions principally modifies the sheath thereby affecting the direct transport of charged particle toward the wall or substrate. In some scenarios they lead to discharge instabilities. They are also responsible for various plasma chemistries. While conventional method of measuring negative ion is based on laser photodetachment in conjunction with Langmuir probe, recently we have demonstrated application of a hairpin probe with laser photodetachment for measuring negative ion density and temperature in an ICP Oxygen discharge1. This paper presents the novel technique in which pulsed bias hairpin is used against pulsed laser photodetachment for the measurement of negative ions. The principle remains the same except that a strong transient negative potential of the order of few 100 Volts allows to discriminate electrons and negative ions responding to the probe at distinct time scales. This results in observing peak electron density immediately post stimulation of the applied negative pulse. Some preliminary results are presented in the oxygen ICP discharge and results are compared with those obtained by hairpin probe assisted laser photo-detachment.
Keywords
electron density; electron detachment; ion density; plasma density; plasma light propagation; plasma probes; plasma temperature; ICP oxygen discharge; Langmuir probe; applied negative pulse stimulation; charged particle; direct transport; discharge instabilities; electronegative plasma diagnostic; fusion devices; hairpin probe assisted laser photodetachment; ion Hall thrusters; ion source; negative ion density; negative ion measurement; negative ion temperature; neutral beam heating; peak electron density; plasma chemistries; plasma etching; plasma processing; pulse bias hairpin probe; pulsed bias hairpin; pulsed laser photodetachment; sheath; time scales; transient negative potential; Discharges (electric); Fault location; Measurement by laser beam; Plasmas; Probes; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science (ICOPS), 2012 Abstracts IEEE International Conference on
Conference_Location
Edinburgh
ISSN
0730-9244
Print_ISBN
978-1-4577-2127-4
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2012.6383656
Filename
6383656
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