Title :
A Digitally Calibrated Current-Voltage Feedback Transconductor in 0.13-μm CMOS Process
Author :
Lin, Ying-Zu ; Liu, Yen-Ting ; Chang, Soon-Jyh
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan
Abstract :
A digitally calibrated transconductor for high-speed operation with its linearity enhanced by negative feedback is proposed. This voltage-to-current converter is mainly composed of two parts: an operational transconductance amplifier (OTA) and a pair of feedback resistors. The measured spurious free dynamic range (SFDR) of the transconductor is 72.6 dB when the input frequency is 100 MHz. To compensate common-mode deviation due to process variation, digital calibration circuits are added. Fabricated in TSMC 0.13-μm CMOS process, the transconductor occupies 250 × 200 μm2 active area and consumes 5.06 mW from a 1.2-V supply.
Keywords :
CMOS integrated circuits; circuit feedback; mixed analogue-digital integrated circuits; operational amplifiers; CMOS process; TSMC; common-mode deviation; digital calibration circuits; digitally calibrated current-voltage feedback transconductor; feedback resistors; frequency 100 MHz; high-speed operation; mixed-signal circuits; negative feedback; operational transconductance amplifier; power 5.06 mW; size 0.13 μm; spurious free dynamic range; voltage 1.2 V; voltage-to-current converter; CMOS process; Dynamic range; Frequency measurement; Linearity; Negative feedback; Operational amplifiers; Resistors; Transconductance; Transconductors; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2006. ASSCC 2006. IEEE Asian
Conference_Location :
Hangzhou
Print_ISBN :
0-7803-9734-7
Electronic_ISBN :
0-7803-97375-5
DOI :
10.1109/ASSCC.2006.357875
