Title :
On numerical weight optimization for random testing
Author :
Hartmann, Joachim
Author_Institution :
Fachbereich 14.1 - Inf., Univ. of Saarbrucken, Germany
Abstract :
The author points out that to make pseudorandom testing usable for circuits containing random pattern resistant faults, input probabilities are weighted. New results on numerical weight optimization are presented. First, two cost functions which are aimed at minimizing the expected test length and at maximizing the expected fault coverage, respectively, are derived. Optimizations based on precomputed tests are then considered. Applying numerical methods to such optimizations yields a method which improves existing strategies
Keywords :
built-in self test; circuit optimisation; integrated circuit testing; logic testing; BIST; cost functions; input probabilities; numerical weight optimization; precomputed tests; pseudorandom testing; random pattern resistant faults; random testing; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cost function; Fault detection; Hardware; Optimization methods; Test pattern generators; Very large scale integration;
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
DOI :
10.1109/EDAC.1993.386472
