• DocumentCode
    2560646
  • Title

    Calibration of the error from spectrum estimation for a dual energy CT

  • Author

    Peng Zheng ; Yuxiang Xing

  • Author_Institution
    Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    3591
  • Lastpage
    3595
  • Abstract
    Dual energy computed tomography (DECT) can be used for substance discrimination by reconstructing the effective atomic number and electron density distribution of scanned object. One critical requirement for DECT reconstruction is estimating both high- and low- energy spectra used in DECT imaging. The estimates of spectra are almost-for-sure off from real spectra to some extend depending on the spectrum estimation methods and data available for spectrum estimation. Hence, systematic error in DECT reconstructions is expected due to spectrum mismatch. In this work, we work on a quantitative way to measure the spectrum estimation error and its effect on DECT reconstructions. A new definition of error using a pseudo data set is introduced and the error propagation is studied. With that quantitative estimation of error, we proposed a method to calibrate the general DECT decomposition and hence increase the accuracy of the DECT reconstruction. According to our simulation experiments, the systematic bias in DECT reconstruction due to spectrum estimation error can be largely reduced. Hence, the DECT system can perform better in discriminating different materials.
  • Keywords
    calibration; computerised tomography; electron density; image reconstruction; measurement errors; medical image processing; DECT decomposition; DECT imaging; DECT reconstruction; DECT system; calibration; dual energy CT; dual energy computed tomography; effective atomic number; electron density distribution; spectrum estimation error; systematic error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551824
  • Filename
    6551824