DocumentCode :
2560650
Title :
On the design and analysis of unmatched LFSR pattern generators in pseudorandom testing
Author :
Li, Weitlong ; McCrosky, Carl ; Abd-El-Barr, Mostafa
Author_Institution :
Dept. of Comput. Sci., Univ. of Saskatchewan, Saskatoon, Sask., Canada
fYear :
1993
fDate :
22-25 Feb 1993
Firstpage :
217
Lastpage :
222
Abstract :
An area efficient design of unmatched pattern generators with dynamic connections for circuits with many inputs is presented. For a circuit with n inputs, instead of requiring n flip-flops, the design needs only m + [n/m] flip-flops and a connection mapping network. m flip-flops are used to construct a primary LFSR (linear feedback shift register) for pattern generation. The other [n/m] flip-flops form a secondary LFSR that dynamically changes the connections between the primary LFSR outputs and circuit inputs by controlling the mapping network. Experiments show that the proposed design is less costly in area as compared to matched designs and also achieves better test quality than either the matched or unmatched designs with static connections
Keywords :
built-in self test; flip-flops; integrated circuit testing; logic testing; shift registers; BIST; area efficient design; circuits with many inputs; connection mapping network; dynamic connections; flip-flops; pseudorandom testing; unmatched LFSR pattern generators; Circuit faults; Circuit testing; Complexity theory; Feedback circuits; Hardware; Pattern analysis; Pattern matching; Random sequences; Software testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on
Conference_Location :
Paris
Print_ISBN :
0-8186-3410-3
Type :
conf
DOI :
10.1109/EDAC.1993.386473
Filename :
386473
Link To Document :
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